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Test System measures NVG-compatible lighting and displays.

2015-08-28 14:31:05| Industrial Newsroom - All News for Today

Utilizing concave, aberration-corrected grating spectrograph, OL 770-NVS Night Vision Display Test and Measurement System allows for NVIS compatible testing of Tungsten backlit devices without need for additional filters and system calibrations. Laboratory-grade TE-cooled, back thinned detector enables fast measurements of spectral radiance, luminance, chromaticity, NVISa and NVISb, while exceeding all MIL-L-86762A Appendix B / MIL-STD-3009 requirements.

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