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Thermal Probe yields consistent Bake Cycle S Curve.

2014-05-13 14:30:47| Industrial Newsroom - All News for Today

Placed under bread or bun dough, Pan+Dough Probe simultaneously captures pan/dough interface temperature and dough core temperature. Readings are used to produce Bake Cycle S Curve indicating critical temperature points for yeast kill, gelatinization, and arrival time as they relate to percentage of travel through baking chamber. Since stationary vertical probe is always at fixed penetration depth, measurements are always at same reference point from one batch to next. This story is related to the following:Temperature Probes

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Category:Industrial Goods and Services

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