Anritsu’s new paper describes the difference in how VNA's and time domain based instruments generate S-parameters and includes the examination of VNA time domain transformations and how they are effected by VNA bandwidth, frequency step size and low frequency S-Parameter quality; s-parameter quality metrics, including indications of measurement issues; channel characterization and measurement frequencies as it applies to bit rates and encoding; andVNA de-embedding and network extraction tools as a way to simplify measurements.