je.st
news
X-Ray Based CMM is designed for metrology.
2015-05-07 14:31:06| Industrial Newsroom - All News for Today
Along with 225 kV X-ray source with 2 micron minimum detectability, CXMM 50 features built-in temperature control and vibration-isolated granite table that promote precise and accurate measurements. X-ray test system, suited for use as product development and QC tool, is fitted with flat panel DDA detector and intended for inspection of workpieces up to 11 kg with envelope up to 30 x 30 cm. Other features include 5-axis manipulator, adjustable magnification, and paired software package.
Tags: based
designed
cmm
metrology
Category:Industrial Goods and Services