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ZEISS Industrial Metrology Surface and Roundness Measurement Systems Offer Additional Analysis for Increased Productivity

2015-05-08 12:31:09| Industrial Newsroom - All News for Today

MAPLE GROVE, Minn. -- The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with their new detectors. SURFCOM NEX 100 offers a single hybrid detector to measure surface texture and contour at the same time. RONDCOM NEX Rs offers best-in-class spindle accuracy and...

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