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Agilent Technologies Announces Collaboration with Nippon Avionics to Develop Enhanced Thermal ...
2014-06-09 06:00:00| Industrial Newsroom - All News for Today
SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced its collaboration with Nippon Avionics (Avio) on the co-development of enhanced thermal imager solutions. The first product of their collaboration is the Agilent U5855A TrueIR thermal imager, a handheld thermal imager solution.<br /> <br /> The two companies jointly developed the unique U5855A, fusing the best of each company's technology and expertise.<br /> <br /> Avio, a provider of high-quality thermography ...This story is related to the following:Vision SystemsSearch for suppliers of:
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Hudson Technologies, Inc. Announces Pricing of Underwritten Public Offering of Common Stock
2014-06-07 12:49:53| Waste Management - Topix.net
The offering is expected to close on or about intends to use the net proceeds from this offering for working capital and general corporate purposes which may include, among other things, funding acquisitions, although the Company has no present commitments or agreements with respect to any such transactions.
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technologies
DOE to award up to $4.6M for innovations in fuel cell and hydrogen fuel technologies
2014-06-06 13:30:31| Green Car Congress
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Agilent Technologies' Waveform Generator/Fast Measurement Unit Used In NBTI Industry Defining Solution Research At IIT Bombay
2014-06-06 12:25:30| rfglobalnet Home Page
Agilent Technologies Inc. recently announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC and AC stress tests.
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industry
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Agilent Technologies' Waveform Generator/Fast Measurement Unit Used In NBTI Industry Defining Solution Research At IIT Bombay
2014-06-06 12:25:30| wirelessdesignonline News Articles
Agilent Technologies Inc. recently announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC and AC stress tests.
Tags: research
industry
unit
solution
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