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FEI Adds Phase Plate Technology and Titan Halo TEM to Its Structural Biology Product Portfolio

2014-07-28 06:00:00| Industrial Newsroom - All News for Today

New solutions provide the high-quality imaging and contrast necessary to analyze the 3D structure of molecules and molecular complexes.<br /> <br /> Hillsboro, Ore. &mdash; FEI (NASDAQ: FEIC) announced two new products for cryo-electron microscopy applications: a new phase plate solution and the Titan Halo&trade; transmission electron microscope (TEM). The phase plate is a stable, durable solution to increase the contrast of sensitive biological samples and is available on most TEM platforms ...This story is related to the following:Electron Microscopes

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Sample Holder for In Situ TEM can heat samples to over 1000°C.

2014-05-21 14:30:39| Industrial Newsroom - All News for Today

Suited for scientists studying structure-function relationship of materials, NanoEx&trade;-i/v sample holder can be integrated with FEI transmission electron microscopes (TEMs) to observe effects of heating and electrical bias on nanostructured materials during in situ experiments. Holder is optimized to accept various sample geometries, from nanoparticles to thin FIB-prepared lamellae, and includes MEMS-based heating element as well as contacts for applying electrical bias. This story is related to the following:Chemical Processing and Waste ManagementSearch for suppliers of: Sample Preparation Equipment | Microscope Accessories

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California Senate President pro tem proposes carbon tax on transportation fuels

2014-02-21 17:30:30| Green Car Congress

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TEM Sample Preparation Workflow promotes high throughput.

2013-11-06 14:29:40| Industrial Newsroom - All News for Today

Suitable for use in transmission electron microscopy (TEM) analysis, ExSolve&trade; can prepare site-specific, 20 nm thick TEM lamella on whole wafers up to 300 mm dia. Solution can sample many sites per wafer in fully automated process inside fab, and wafer TEM prep (WTP) increases speed of sample preparation. This provides semiconductor and data storage manufacturers with access to data needed to verify and monitor process performance. FOUP handling capability is standard. This story is related to the following:Sample Preparation Equipment

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FEI Revolutionizes the World of TEM with the Introduction of Three New Systems

2013-08-01 06:00:00| Industrial Newsroom - All News for Today

The new TEM systems continue FEI's emphasis on technology leadership while redefining its product portfolio for efficient and effective application-specific workflows<br /> <br /> Hillsboro, Ore. &mdash; FEI (NASDAQ: FEIC) today introduced three new systems that tailor the power of transmission electron microscopy (TEM) to specific application and industry needs. The new systems launched today provide efficient and effective application-specific workflows for semiconductor manufacturing and ...This story is related to the following:Electron Microscopes

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