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Axalta Scientist Presents Rheological Characterization of Drying Process for Automotive Coatings

2015-06-16 07:00:00| Coatings World Breaking News

Tags: process automotive presents characterization

 

FEI and Weatherford Enter Into Joint Agreement for Advanced Reservoir Characterization Services

2015-05-18 15:16:25| Electronics - Topix.net

FEI and Weatherford Laboratories have entered into a joint agreement to offer advanced reservoir characterization services to the oil and gas industry. The two companies will work together to create new workflows that integrate Weatherford's traditional core analysis and FEI's digital rock imaging, modeling and interpretation.

Tags: services advanced enter agreement

 
 

FEI and Weatherford Enter Into Joint Agreement for Advanced Reservoir Characterization Services

2015-05-18 14:49:47| Semiconductors - Topix.net

FEI and Weatherford Laboratories have entered into a joint agreement to offer advanced reservoir characterization services to the oil and gas industry. The two companies will work together to create new workflows that integrate Weatherford's traditional core analysis and FEI's digital rock imaging, modeling and interpretation.

Tags: services advanced enter agreement

 

Dialog Semiconductor Adopts Keysight Technologies' Device Characterization, Modeling Software Suite

2015-05-13 13:28:22| rfglobalnet Home Page

Dialog Semiconductor has adopted Keysight Technology Inc.'s suite of device-modeling softwareto perform foundry technology characterization, model validation, model customization and enhancement.

Tags: software suite technologies device

 

Cadence and Intel Collaborate to Release 14nm Library Characterization Reference Flow for Customers of Intel Custom Foundry

2015-03-23 11:31:17| Industrial Newsroom - All News for Today

Cadence Virtuoso Liberate Characterization Solution and Spectre Circuit Simulator Together Enable Accurate 14nm Logic Libraries SAN JOSE, Calif.  Cadence Design Systems Inc. (NASDAQ: CDNS) and Intel Corporation today announced that the two companies have delivered a 14nm (nanometer) library characterization...

Tags: reference library release customers

 

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