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Keysight Technologies Introduces Industry's Most Comprehensive Reference Solution For Full Characterization Of Next-Generation Power Amplifier Modules

2014-09-17 08:16:06| rfglobalnet Home Page

Keysight Technologies, Inc. recently announced a new PXI Reference Solution for RF power amplifier (PA) characterization and test. The Reference Solution, which performs S-parameter, harmonic distortion, power and demodulation measurements, enables rapid, full characterization of next-generation power amplifier modules, such as a power amplifier-duplexer (PAD).

Tags: full power reference solution

 

Keysight Technologies Introduces Industry's Most Comprehensive Reference Solution For Full Characterization Of Next-Generation Power Amplifier Modules

2014-09-17 08:16:06| wirelessdesignonline News Articles

Keysight Technologies, Inc. recently announced a new PXI Reference Solution for RF power amplifier (PA) characterization and test. The Reference Solution, which performs S-parameter, harmonic distortion, power and demodulation measurements, enables rapid, full characterization of next-generation power amplifier modules, such as a power amplifier-duplexer (PAD).

Tags: full power reference solution

 
 

Characterization System aids materials science research.

2014-09-09 14:30:51| Industrial Newsroom - All News for Today

Capable of seeing structure and composition and adding/removing material at nanometer scale, Helios NanoLab™ G3 DualBeam™ allows scientists to explore fundamental relationships between structure and function. CX configuration offers versatile sample handling and positioning for flexible analysis, sample preparation, and characterization, while UC configuration delivers increased sensitivity to surface detail and optimized performance on soft, non-conductive, or beam-sensitive materials. This story is related to the following:Materials Characterization Instruments

Tags: system research science materials

 

Broadband Vector Network Analyzer for On-Wafer Device Characterization: VectorStar ME783D Datasheet

2014-05-29 20:45:07| rfglobalnet Downloads

Anritsu’s ME783D is part of their line of VectorStarTM vector network analyzers. It covers the 70 kHz to 145 GHz frequency range and is ideal for on-wafer device characterization.

Tags: network device vector broadband

 

Broadband Vector Network Analyzer for On-Wafer Device Characterization: VectorStar ME783D

2014-05-29 20:41:58| rfglobalnet Home Page

This VNA covers the 70 kHz to 145 GHz frequency range in a single-sweep through a coaxial test port. It’s ideal for on-wafer device characterization for E band wireless communications, 94 GHz remote sensing and airport radar, 77 GHz car radar, and other emerging applications that run above 110 GHz.

Tags: network device vector broadband

 

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