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MicroSense Ships Novel LED Sapphire Wafer Measurement Tools for Process Control
2014-06-12 06:00:00| Industrial Newsroom - All News for Today
LOWELL, Mass. — MicroSense, LLC, a leader in non-contact wafer metrology systems, today announced multiple shipments of its new, next-generation automated sapphire wafer metrology tool, the MicroSense UltraMap C200. Designed specifically for high throughput dimensional measurement of sapphire wafers for LED manufacturing, the UltraMap C200 provides throughput of ninety 6" diameter sapphire wafers per hour with lowest cost of ownership (CoO). The UltraMap C200 utilizes MicroSense's ...This story is related to the following:Mounting and Attaching ProductsSearch for suppliers of: Wafer Handling Tools
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Lockheed Martin Applies Wind Measurement Technology for More Precise Cargo Airdrops to U.S. ...
2014-06-12 06:00:00| Industrial Newsroom - All News for Today
WindTracer® for Precision Air Drop to Demonstrate Faster, Safer Supply Deliveries<br /> <br /> PALO ALTO, Calif. – The U.S. Air Force Research Laboratory (AFRL) has awarded Lockheed Martin [NYSE: LMT a contract to adapt its WindTracer® wind measurement system to help C-130 and C-17 aircrews make safer, faster and more accurate airdrops of essential supplies to U.S. ground forces at remote locations.<br /> <br /> Under the contract, Lockheed Martin will design and build a prototype ...This story is related to the following:Optics and PhotonicsSearch for suppliers of: Lidar Systems
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Get True Solder Paste Measurement and Accurate Pre-reflow Inspection from CyberOptics at ...
2014-06-12 06:00:00| Industrial Newsroom - All News for Today
CyberOptics Corporation (Nasdaq: CYBE) announces that it will showcase the new QX150i™ AOI system in Booth D525 at NEPCON Thailand, scheduled to take place June 19-22, 2014 in the Singapore Pavilion. The multi-award winning SE600™ 3D SPI system and QX100™ tabletop AOI system also will be displayed at the show. All CyberOptics’ inspection solutions come with the assurance of quality, accuracy and speed.<br /> <br /> The new QX150i™ AOI system offers high value and ...This story is related to the following:Solder Paste Inspection Systems | 3D Inspection Systems
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Application And Measurement Of Ultra-Low-Noise Oscillators
2014-06-11 17:34:52| rfglobalnet Downloads
Low phase noise signal sources are an essential component of many highperformance electronic systems, and range from single-frequency generators to multichannel synthesisers. Common to almost all of these is that the output frequencies are derived from one or more crystal oscillators, by means including frequency multiplication and division, phase-locked loop (PLL), direct digital synthesis (DDS) etc. By Garry Thorp, RF engineer, Pascall Electronics Ltd
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measurement
oscillators
measurement application
World's Fastest Antenna Measurement System
2014-06-09 19:40:34| rfglobalnet Home Page
Michael Hillburn with Diamond Engineering explains how his company collaborated with Copper Mountain Technologies in order to create the world’s fastest antenna measurement system with the help of a high-speed vector network analyzer. Watch the video to see it in action.
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measurement
worlds
fastest
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