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NIST Launches A New U.S. Time Standard: NIST-F2 Atomic Clock

2014-04-08 08:30:47| rfglobalnet News Articles

The U.S. Department of Commerce's National Institute of Standards and Technology (NIST) has officially launched a new atomic clock, called NIST-F2, to serve as a new U.S. civilian time and frequency standard, along with the current NIST-F1 standard.

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Electrical Transmission At The Atomic Level

2014-04-08 07:08:56| rfglobalnet News Articles

In a study on the transport of atoms in ultracold gases, a team of physicists led by Dr. Sandro Wimberger has developed a new approach to how signals might be transmitted at the atomic level.

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Handheld Spectrum Analyzer offers internal atomic clock option.

2014-03-04 14:30:46| Industrial Newsroom - All News for Today

Delivering accuracy needed to prove regulatory compliance, MS2720T Spectrum Master™ supports internal atomic clock option that enables optimized acquisition of frequency reference without requiring GPS. Calibration accuracy of atomic clock is 1x10(-9), and module is automatically used once installed. Along with touchscreen, analyzer features dynamic range of >106 dB in 1 Hz RBW, DANL of -163 dBm in 1 Hz RBW, and Phase Noise of -112 dBm @ 10 kHz offset at 1 GHz. This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of:

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Anritsu Company Introduces Internal Atomic Clock For Spectrum Master

2014-02-28 08:28:46| rfglobalnet Home Page

Anritsu Company introduces an internal atomic clock option for its MS2720T Spectrum Master handheld spectrum analyzer that allows users to acquire excellent frequency accuracy, including in environments in which the GPS cannot be used.

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Atomic Force Microscopes sense both resistance and capacitance.

2014-01-27 14:31:31| Industrial Newsroom - All News for Today

Based on shielded AFM probes and electronics from PrimeNano, Inc., sMIM Scanning Microwave Impedance Microscopy is integrated exclusively with MFP-3D™ and Cypher™ AFMs. Technique enables nanoscale mapping of permittivity and conductivity on linear and non-linear materials, including conductors, semiconductors, and insulators. sMIM is applicable to broad range of samples, including ferroelectrics, piezoelectrics, and low-dimensional nanomaterials such as graphene and boron nitride. This story is related to the following:Atomic Force Microscopes

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