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Park Systems Introduces Park NX20 Atomic Force Microscope, The Leading AFM Nano Metrology Tool For Device Failure Analysis

2013-05-10 08:30:19| metrologyworld News Articles

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX20, an enhanced design of the already successful XE series that assures the highest level of precision for roughness measurement and defect review

Tags: systems park analysis leading

 

GPz550 Motorcycle Racer Corey Clough Won AFM Formula Vintage Race at Buttonwillow Raceway

2013-04-05 18:46:18| K&N Racing News

Corey Clough races in various divisions with the American Federation of Motorcyclists and focuses on improving as a rider at each and every event.

Tags: won race formula vintage

 

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