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Tag: afm
AFM systems take a tip from nanowires
2014-05-23 22:06:01| Semiconductors - Topix.net
In response to requests from the semiconductor industry, a team of PML researchers has demonstrated that atomic force microscope probe tips made from its near-perfect gallium nitride nanowires are superior in many respects to standard silicon or platinum tips in measurements of critical importance to microchip fabrication, nanobiotechnology, and ... (more)
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nanowires
AFM Accessory enables scanning electrochemical microscopy.
2014-05-20 14:30:58| Industrial Newsroom - All News for Today
AFM-enabled Scanning Electrochemical Microscopy (SECM) mode, using Agilent atomic force microscope, lets scientists perform scanning electrochemical microscopy with nanoscale resolution on conductive and insulating samples. Enabling immediate data collection, EC SmartCart cartridge combines nanoelectrode with pre-mounted AFM tip. Features include bi-functional probes, in situ research capabilities, built-in potentiostat, dual-chamber glove box, and Agilent PicoView software. This story is related to the following:Microscope Accessories |
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scanning
microscopy
Carbon Nanotube Probes support AFM imaging.
2014-02-18 14:33:37| Industrial Newsroom - All News for Today
Cylindrically shaped and extremely narrow, Performance Family of CNT Probes for Atomic Force Microscopy reveal greater detail, across larger surface and with fewer artifacts than standard AFM probes that are pyramidal in shape. Durability of probes translates into reproducibility between images and samples. Units are available on variety of cantilevers and in several length ranges depending upon users' need for high-aspect ratio or extremely high-aspect ratio imaging. This story is related to the following:Cantilever Probes | Carbon Nanotubes
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Virtek Vision Joining Gebrüder Spiegel AG to Present LaserQC AFM Inspection and Iris ...
2013-10-15 06:00:00| Industrial Newsroom - All News for Today
The 11th International trade fair for sheet metal working will be held November 5 through 8 at the Stuttgart Exhibition Centre.<br /> <br /> WATERLOO, Canada - Virtek Vision International announced today their participation with Gebrüder Spiegel AG in hall 7, Gasparini stand 7515 at Blechexpo. Virtek will be presenting its LaserQC® Automatic Form Measurement (AFM) system and Iris™ SPS (Spatial Positioning System). The 11th International trade fair for sheet metal working will be held ...This story is related to the following:Test and Measuring InstrumentsLaser Inspection Systems |
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joining
AFM Probes offer automated calibration.
2013-09-06 14:30:26| Industrial Newsroom - All News for Today
Supplied with MFP-3D™ and Cypher™ atomic force microscope probes, GetReal™ Automated Probe Calibration feature fully calibrates probe sensitivity and spring constant, enabling consistent, accurate results. Based on thermal noise method and Sader method, non-contact calibration also protects probe from damage that occurs with conventional calibration methods, preserving sharpest tip for highest resolution imaging. This story is related to the following:Optics and Photonics Sponsored by: OFS Specialty Photonics Div - OFS Cat Sponsor for Vert Banner replacementProbes | Calibration Management Software
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