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Home › NI Lowers Semiconductor ATE Cost With PXI-Based Test Systems

 

NI Lowers Semiconductor ATE Cost With PXI-Based Test Systems

2014-08-06 13:30:26| rfglobalnet Home Page

NI, the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, recently announced the NI Semiconductor Test System (STS) series.

Tags: test systems cost ate

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