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Teradyne Introduces the Magnum V Memory Test System
2014-07-07 13:21:13| Semiconductors - Topix.net
The Magnum V's scalable platform extends the capabilities of the Magnum product line with higher pin count, higher device under test parallelism, higher frequency, coverage for high-speed Flash and mobile DRAM, and lower per-pin cost for achieving a lower total cost-of-test.
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test
memory
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Category:Electronics and Electrical
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