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Semiconductor Test Probe meets HED device testing challenges.
2015-09-02 14:31:03| Industrial Newsroom - All News for Today
With 5.0 mm test height that provides total compression window of 0.8 mm and insertion loss of 18 GHz @ -1 dB (GSG), ZIP™ semiconductor test probe model Z-080YHJ targets high-lead count BGAs and LGAs and meets challenges associated with testing High End Digital (HED) devices. DUT side plunger, which is made from HyperCore™ homogenous alloy, features sharp, dual tip geometry for facilitated penetration of solder ball oxides. Product is based on flat probe technology.
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testing
device
challenges
Anritsu To Address High-Speed Design Test Challenges For Next Generation Networks At DesignCon 2015
2015-01-27 01:41:50| wirelessdesignonline News Articles
Anritsu Company will provide engineers developing leading-edge products with solutions to meet their most challenging test requirements during DesignCon 2015, to be held January 28-29 in Santa Clara, CA.
Tags: address
design
test
generation
Anritsu To Address High-Speed Design Test Challenges For Next Generation Networks At DesignCon 2015
2015-01-27 01:41:50| rfglobalnet Home Page
Anritsu Company will provide engineers developing leading-edge products with solutions to meet their most challenging test requirements during DesignCon 2015, to be held January 28-29 in Santa Clara, CA.
Tags: address
design
test
generation
802.11ac Test Challenges Take Off
2014-07-07 22:35:22| Wireless - Topix.net
IEEE 802.11ac has proven popularity now. That's because service providers have a critical need to offload their traffic and because the industry doesn't foresee any other major standards emerging in the near future.
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challenges
challenges test
test challenges
MPI Corporation Introduces Advanced Semiconductor Test Division To Solve Key Challenges In Reducing Overall Cost Of Test
2014-06-06 11:43:12| metrologyworld News Articles
MPI Corporation(GTSM 6223) recently introduced the new Advanced Semiconductor Test (AST) division which is built on a unique combination of manufacturing excellence and systems reliability incorporated from MPI's worldwide market leadership position in LED Test Solutions, and decades of engineering probe systems market expertise from the AST management team
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