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Tag: surface
SIFCO, ASC, and Surface Technology Create Dynamic Force in Coatings Technology
2015-05-20 13:54:00| Power Technology
Norman Hay plc has created a new specialist coatings group, incorporating SIFCO Applied Surface Concepts (ASC) and Surface Technology, to provide a single global access point in surface coating technology.
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technology
force
surface
Surface Testers measure roughness, contour, and finish.
2015-05-14 14:31:05| Industrial Newsroom - All News for Today
Using diamond stylus that is drawn across part with motorized traverse mechanism, Surtronic Duo offers portable solution for shop floor and on-site measurement of multiple roughness parameters. One-button operation produces set of traceable measurement results including detailed profile graph. With 1 mm vertical range and 16 nm resolution, IntraTouch provides fundamental roughness and waviness parameters, contour and form error analysis, feature exclusion, zoom tool, and full programmability.
Tags: surface
measure
finish
contour
Demand for vinyl in U.S. will boost hard surface flooring industry: report
2015-05-11 20:50:23| Canadian Plastics Headlines
Led by a growing demand for vinyl, the hard surface flooring industry in the U.S. is forecast to advance 6.1 per cent per year to 11.3 billion square feet in 2019 valued at US$16.7 billion according to a… The post Demand for vinyl in U.S. will boost hard surface flooring industry: report appeared first on Canadian Plastics.
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hard
industry
surface
ZEISS Industrial Metrology Surface and Roundness Measurement Systems Offer Additional Analysis for Increased Productivity
2015-05-08 12:31:09| Industrial Newsroom - All News for Today
MAPLE GROVE, Minn. -- The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with their new detectors. SURFCOM NEX 100 offers a single hybrid detector to measure surface texture and contour at the same time. RONDCOM NEX Rs offers best-in-class spindle accuracy and...
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offer
systems
analysis
ZEISS Industrial Metrology Surface And Roundness Measurement Systems Offer Additional Analysis For Increased Productivity
2015-05-08 07:56:16| metrologyworld Home Page
The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with their new detectors
Tags: additional
offer
systems
analysis
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