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New analysis shows C-band spectrum is most expensive in Italy

2020-01-06 01:00:00| Total Telecom industry news

Since 2015, the Global mobile Suppliers Association (GSA) has identified 23 countries that have auctioned or allocated C-band for 5G usage.   The prices fluctuate drastically between these countries based on a myriad of factors: the amount of competition…read more on TotalTele.com »

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Anritsu Introduces High-performance OEM Solution For Spectrum Analysis Systems Used In Security, Aerospace/Defense Applications

2016-05-20 04:03:34| rfglobalnet Home Page

Anritsu Company, the industry leader in field spectrum analysis tools, introduces the MS27100A Spectrum Monitoring Module that brings Anritsu’s field-proven, industry leading RF spectrum analysis technology to OEM applications.

Tags: systems security analysis applications

 
 

Spectrum Monitoring And Interference Analysis Using NI PXI

2016-04-19 13:25:43| rfglobalnet Downloads

Interference has unfortunately become much more prevalent with an increasing number of transmitters coming on the air. Wireless service providers will use spectrum analyzers to monitor their channels, frequencies, and adjacent spectrums to reveal the interfering signal to the user. In order to increase the functionality and expandability of a spectrum analyzer for improved monitoring and interference management, NI (National Instruments) has paired their PXI hardware with the OASIS spectrum monitoring package to enable deployment of multiple spectrum analyzers with high throughput and improved service.

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Airbus Defence & Space and Spectrum conduct a joint analysis of offshore Porcupine Basin potential; radar satellites plus 2D seismic data

2015-06-08 14:55:38| Green Car Congress

Tags: data plus analysis potential

 

Microwave VNAs support integrated spectrum analysis capability.

2015-05-20 14:31:05| Industrial Newsroom - All News for Today

PNA and PNA-X Series microwave vector network analyzers (VNAs) support spectrum analyzer capability, which simplifies system connections and conserves time by instilling high-speed spurious measurements in instruments used to characterize S-parameters, compression, and distortion. Also, VNAs can perform simultaneous spectrum measurements on all test ports, while in-fixture and on-wafer measurements gain benefits of VNA calibration and de-embedding.

Tags: support analysis integrated spectrum

 

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