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Tag: xray
PANalytical Introduces New Detector of Choice for X-ray Diffraction with Hard Radiation
2015-03-19 06:00:00| Coatings World Breaking News
Tags: with
hard
choice
radiation
Nova to Acquire ReVera, Provider of Advanced X-Ray Metrology Solutions, to Strengthen Position in Advanced Process Control Market
2015-03-17 11:31:08| Industrial Newsroom - All News for Today
Acquisition expected to be accretive to non-GAAP EPS and provide differentiated portfolio for meeting customers' challenging wafer fabrication processes REHOVOT, Israel Conference Call at 10 a.m. ET on March 12, 2015 Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical...
Tags: advanced
control
process
market
Radiation Sensor enables survey measurements in X-ray range.
2015-03-13 13:31:06| Industrial Newsroom - All News for Today
Designed to minimize need for user interaction, RaySafe X2 Survey sensor can perform leakage and scatter measurements in diagnostic X-ray applications. Trigger modes, manual and automatic, allow this silicon-based sensor to capture low dose-rate measurements in X-ray machine's primary beam. Unit also offers ability to switch energy response between Air Kerma (Gy or R) and Ambient Dose Equivalent (Sv). Sensor can be shipped without any special considerations or arrangements.
Tags: range
survey
enables
measurements
ZEISS Showcases Electron and X-ray Microscopes, Digital Imaging Systems and Stereo Microscopes at PITTCON 2015
2015-03-11 11:31:13| Industrial Newsroom - All News for Today
Carl Zeiss Microscopy, a leading provider of microscopy solutions, announces that it will be showcasing state of the art electron and X-ray microscopes, digital imaging systems for QA/QC and particle analysis, and stereo microscopes suited for heavy workloads at PITTCON 2015, March 8-13, Booth #4317, in New Orleans...
Tags: digital
systems
stereo
imaging
Multiple X-ray Technologies Integrated in Groundbreaking Zetium Spectrometer from PANalytical
2015-03-11 06:00:00| Coatings World Breaking News
Tags: multiple
technologies
integrated
spectrometer
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