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Intelligent Breakout Boxes simplify NVH testing.

2014-06-17 14:32:23| Industrial Newsroom - All News for Today

When incorporated into test solution with EMX-425X series modular dynamic signal analyzers, 8-chanel EMX-4008 and 16-channel EMX-4016 provide external trigger connector and external calibration input connector to facilitate and simplify triggering and calibration of EMX-425X cards. Both replaceable breakout boxes (BOBs) provide BNC interfaces and support full range of capability of EMX-4250 series, including sampling rates to 204.8 kSa/s/channel and deterministic multi-channel phase response. This story is related to the following:Electrical Control Boxes | Breakout Boxes

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Atlas Material Testing Technology Exhibits at Intersolar NA 2014

2014-06-17 06:00:00| Industrial Newsroom - All News for Today

CHICAGO - Atlas Material Testing Technology, the industry leader in solar durability testing, will exhibit at Intersolar North America 2014 (Booth#7726), the premier North American solar conference and exhibition, July 8-10 at the Moscone Center in San Francisco, CA.<br /> <br /> As an active participant in global standards committees and industry consortiums on photovoltaic (PV) durability, Atlas has extensive knowledge and experience in providing customized weathering and environmental ...This story is related to the following:Laboratory and Research Supplies and EquipmentElectrical Equipment and Systems Sponsored by: Globtek Inc. - MOBILE BANNER ADEnvironmental Testers | Environmental Chambers | Solar Energy Equipment |

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Family Of RF VNAs For Variety Of Passive Device Testing Environments Introduced By Anritsu Company

2014-06-16 21:57:22| rfglobalnet Home Page

Anritsu Company addresses the market need for value and performance when testing RF passive devices with the introduction of the ShockLine™ MS46522A 2-port RF VNA family with frequency coverage from 50 kHz to 8.5 GHz. The ShockLine MS46522A VNA is designed for testing passive devices such as cables, connectors, filters, and antennas in a wide variety of engineering, manufacturing and education applications.

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Unisem Adds Teradyne FLEX Test System in Sunnyvale, CA for Mixed Signal and RF Testing Capabilities

2014-06-14 12:33:00| Electronics - Topix.net

The addition of the FLEX test system will further expand Unisem's existing testing capabilities in the mixed signal and RF spaces.

Tags: system test testing mixed

 

Unisem Adds Teradyne FLEX Test System in Sunnyvale, CA for Mixed Signal and RF Testing Capabilities

2014-06-14 08:44:47| Semiconductors - Topix.net

The addition of the FLEX test system will further expand Unisem's existing testing capabilities in the mixed signal and RF spaces.

Tags: system test testing mixed

 

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