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Agilent Technologies Offers Application Note on LTE-Advanced Manufacturing Test
2014-01-25 06:00:00| Industrial Newsroom - All News for Today
<p> What: The Solutions for LTE-Advanced Manufacturing Test application note provides an understanding of the requirements for LTE-Advanced Carrier Aggregation manufacturing test. It is the newest in the series of Agilent Power of Wireless application notes designed to provide a better understanding into the intricacies of the continuously evolving wireless industry, so you can accelerate your development of products.<br /> <br /> When: Available today<br /> <br /> Where: To obtain the ...
Tags: note
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Agilent Technologies Installs Atomic Force Microscope with Scanning Microwave Microscopy ...
2014-01-23 06:00:00| Industrial Newsroom - All News for Today
SANTA CLARA, Calif. — Agilent Technologies Inc. (NYSE: A) today announced the recent installation of an Agilent 5600LS atomic force microscope at the Cambridge Graphene Centre (CGC) in the United Kingdom. The CGC, one of the key consortium partners in the ambitious Future and Emerging Technologies (FET) Graphene Flagship project, is directed by Andrea Ferrari, professor of nanotechnology at the University of Cambridge.<br /> <br /> In October 2013, Agilent delivered a 5600LS AFM with ...This story is related to the following:Atomic Force Microscopes
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Agilent Technologies Introduces Waveguide Power Sensor For Precise, Accurate E-band Power Measurements
2014-01-23 01:54:05| rfglobalnet Home Page
Agilent Technologies Inc. recently announced the E8486A waveguide power sensor.
Tags: power
accurate
technologies
measurements
Agilent Technologies UXM Wireless Test Set Enables New Insights Into LTE-Advanced Category 6 Chipsets, Devices
2014-01-22 06:54:48| rfglobalnet News Articles
Agilent Technologies Inc. recently introduced the E7515A UXM wireless test set, the most highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond.
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category
test
technologies
Agilent Technologies to Exhibit Digital Design and Test Solutions at DesignCon 2014
2014-01-22 06:00:00| Industrial Newsroom - All News for Today
SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced it will exhibit its high-speed digital solutions shown at DesignCon 2014, Jan. 29-30, Booth 201, in Santa Clara. The products offer a wide range of essential tools to help engineers design, simulate, analyze, debug and achieve compliant designs while meeting the challenges of gigabit digital designs.<br /> <br /> The company will also show its new Agilent EEsof EDA's Controlled Impedance Line Designer, J-BERT ...This story is related to the following:SoftwareBit Error Rate (BERT) Testers | Oscilloscopes | Network Analyzers | Circuit Analyzers |
Tags: design
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