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Agilent Technologies Introduces Physics-Based VCSEL Model to Solve Challenges in Designing ...
2013-10-23 07:00:00| Industrial Newsroom - All News for Today
SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today introduced a physics-based model for its opto model library that quickly and accurately solves the challenges posed by signal distortion in vertical cavity surface emitting lasers (VCSELs) used in rack-to-rack opto links. The new VCSEL model, available in the Advanced Design System 2013 Transient Convolution Element and SystemVue 2013 AMI Modeling Kit, is used both for modeling optoelectronic components and designing them ...This story is related to the following:SoftwareSearch for suppliers of: Design Graphics Software | Modeling Software |
Tags: model
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Agilent Technologies Demonstrates Next Generation Test and Measurement Solutions at AOC ...
2013-10-19 06:00:00| Industrial Newsroom - All News for Today
What: Agilent experts using next generation test and measurement solutions will demonstrate complex signal creation, real time spectrum analysis tools and RF/Microwave handheld field test tools. Specific focus will be on addressing the test challenges professionals face in electronic warfare, information operations and electromagnetic spectrum operations.<br /> <br /> When: Oct. 26-29, 2013 <br /> <br /> Where: Booth #914, Marriot Wardman Park, Washington, DC<br /> <br /> Additional ...This story is related to the following:Electronic Components and Devices Sponsored by: Globtek Inc. - Your Power Partner...For Over 20 Years!Communications Testers | Spectrum Analyzers
Tags: test
solutions
generation
technologies
Agilent Technologies Announces Video Series on PXI Modular Solutions for RF Test
2013-10-18 06:00:00| Industrial Newsroom - All News for Today
What: The videos highlight the advantages of Agilent’s modular PXI RF test solutions that provides a comprehensive suite of hardware and software that work seamlessly together. With the immense growth in wireless industry manufacturing is producing intense pressure to test twice as much in half the time. Each device becomes much more complex - encompassing ever more channels - frequencies - and formats.<br /> <br /> To accelerate RF device testing, Agilent’s PXI state-of-the-art ...
Tags: video
test
series
solutions
Agilent Technologies Announces Application Note on Performing Multi-Antenna Array Measurements ...
2013-10-18 06:00:00| Industrial Newsroom - All News for Today
What: This application note describes an innovative solution for accelerating calibration of multi-antenna arrays using a high-speed, multi-channel digitizer with real-time digital downconversion (DDC). The solution characterizes the element-to-element phase and magnitude errors of the various components in the array. The misalignment of the radiating elements can then be accurately identified and calibrated out to ensure efficient operation of the antenna system.<br /> <br /> When: Available ...
Tags: note
application
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performing
Agilent Technologies' PNA Network Analyzer Metrology Option Sets New Standard In Precision S-Parameter Measurements
2013-10-18 05:38:06| rfglobalnet News Articles
Agilent Technologies Inc. recently introduced a metrology option for its PNA family of network analyzers that offers national metrology institutes and calibration laboratories around the world the ultimate in S-parameter measurement accuracy.
Tags: standard
network
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