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Agilent Technologies' New EXM Wireless Test Set Ready For Volume Production Of LTE-Advanced, 802.11ac WLAN Devices
2013-11-13 02:45:02| wirelessdesignonline News Articles
Agilent Technologies Inc. recently announced the E6640A EXM wireless test set, which offers breakthrough manufacturing-test scalability in technology coverage, performance and capacity to test up to 32 cellular and wireless-connectivity devices in parallel.
Tags: set
test
volume
production
Agilent Technologies' Conformance Test System Enables Certification of First Chinese NFC ...
2013-11-06 06:00:00| Industrial Newsroom - All News for Today
Shanghai Fudan Microelectronics Develops Chipset; Shanghai Integrated Circuit Technology & Industry Promotion Center and TA Certification Lab Lead Test Project<br /> <br /> SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced that the Shanghai Fudan Microelectronics FM1930 chip, the first near field communication (NFC) controller chipset developed by a Chinese microelectronics company, has successfully achieved NFC Forum certification using the Agilent RIDER T3111S ...This story is related to the following:Electronic Components and Devices Sponsored by: Globtek Inc. - Your Power Partner...For Over 20 Years!Search for suppliers of: Communications Controllers | Chip Sets | Integrated Circuit Connectors |
Tags: system
test
chinese
technologies
Agilent Technologies' Signal Studio Software Enables Cost-Effective WLAN DFS Testing
2013-11-05 08:25:12| rfglobalnet News Articles
Agilent Technologies Inc. recently introduced dedicated dynamic frequency selection (DFS) radar-profile creation software to provide engineers performing DFS testing with pre-defined radar signals that support profiles defined by multiple regulatory agencies.
Tags: software
studio
technologies
testing
Agilent Technologies Announces LTE-A Carrier Aggregation Support On Conformance And Design Verification Systems
2013-11-01 07:10:55| wirelessdesignonline News Articles
Agilent Technologies Inc. recently announced new software options for the T4010S LTE RF and T4020S LTE RRM test systems. The new capabilities provide coverage for LTE-Advanced Carrier Aggregation test cases as defined by the 3GPP.
Tags: support
design
systems
technologies
Agilent Technologies Engineers Author X-Parameters* Book
2013-10-30 06:00:00| Industrial Newsroom - All News for Today
Cambridge University Press Publishes Definitive Reference on Topic<br /> <br /> SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced the release of “X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components,” a book on the company’s breakthrough nonlinear X-parameters measurement, modeling and simulation technology. Published by Cambridge University Press, the book offers readers the definitive guide to ...
Tags: author
book
technologies
engineers
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