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Tag: defect
Zero recalling some of its electric motorcycles due to Li-ion battery defect
2013-06-29 19:30:17| Green Car Congress
Tags: due
electric
battery
defect
Defect Inspection System monitors defects at optical speed.
2013-05-07 14:31:08| Industrial Newsroom - All News for Today
Available for 2900 Series of defect inspection systems, NanoPoint™ focuses resources of optical inspection system on critical patterns, as identified by circuit designers or by known defect sites. During chip development, NanoPoint can reveal need for mask re-design within hours, potentially accelerating identification and resolution of design issues from months to days. During volume production, NanoPoint can selectively track defectivity within critical patterns. This story is related to the following:Inspection Devices | Wafer Inspection Systems
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speed
inspection
optical
Pig Stress Syndrome Linked to Gene Defect
2013-04-30 02:00:00| ThePigSite - Industry News
US - A defect in a gene called dystrophin is the cause of a newly discovered stress syndrome in pigs, US Department of Agriculture (USDA) scientists have found.
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linked
gene
syndrome
Nissan recalls 2013 Altima for spare tire defect
2013-04-27 20:12:31| Automakers - Topix.net
Nissan Motor Co. is recalling 123,308 Altima sedans because their spare tires may be over- or underinflated.
Tags: nissan
spare
tire
defect
Rudolph's NSX Macro Defect Inspection System Selected by Merit Sensor Systems
2013-04-10 06:00:00| Industrial Newsroom - All News for Today
The automated inspection system will assure quality of pressure sensors used in critical applications.<br /> <br /> Flanders, New Jersey -- Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor and related industries,announced today that it has sold an NSX®Series macro defect inspection system to Merit Sensor Systems, Inc., a wholly-owned subsidiary of Merit Medical Systems, Inc. (NASDAQ: MMSI), a leading ...This story is related to the following:Surface Defect Detection Systems | Wafer Inspection Systems
Tags: system
systems
selected
inspection
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