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Park Systems Joins Forces With imec To Develop Advancements In Nanoscale AFM Metrology Solutions For Semiconductor Manufacturing

2015-03-12 07:39:15| metrologyworld Home Page

Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness, critical dimension (CD), and sidewall roughness

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Park Systems Announces Joint Development Partnership with imec to Develop Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing

2015-03-09 11:31:11| Industrial Newsroom - All News for Today

SUWON, Korea  Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness...

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3M invests in Nanoscale Components to leverage its pre-lithiation process for 3M silicon anodes

2015-02-19 20:55:36| Green Car Congress

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Antennas Enable Nanoscale Terahertz Spectroscopy

2015-02-13 06:46:39| rfglobalnet Home Page

Nanoantenna-enhanced terahertz spectroscopy (NETS) involves chains of dipole nanoantennas spaced about 20 nm apart.

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All Directions Are Not Created Equal For Nanoscale Heat Sources

2014-10-02 12:10:26| rfglobalnet Home Page

Thermal considerations are rapidly becoming one of the most serious design constraints in microelectronics, especially on submicron scale lengths. A study by researchers from the University of Illinois at Urbana-Champaign has shown that standard thermal models will lead to the wrong answer in a three-dimensional heat-transfer problem if the dimensions of the heating element are on the order of one micron or smaller.

Tags: created sources equal heat

 

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