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Tag: microscopy
Andor EMCCD Camera Delivers Ultrahigh Accuracy for Super Resolution Microscopy
2013-07-30 06:00:00| Industrial Newsroom - All News for Today
Ultrahigh accuracy imaging modality (UAIM) technique provides more than 200% accuracy improvement compared with conventional low-light imaging<br /> <br /> Belfast, UK: Super resolution localization microscopy techniques, which allow the capture of images with a higher resolution than the diffraction limit of approx. 250 nm, are breaking new ground in our understanding of subcellular structures and the movement of individual molecules within cells. However, the positional accuracy attained by ...This story is related to the following:High Resolution Cameras | High Resolution Cameras |
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Atomic Force Microscope offers scanning microwave microscopy.
2013-07-03 14:29:34| Industrial Newsroom - All News for Today
Compatible with Model 5500 AFM, Scanning Microwave Microscopy mode combines compound, calibrated electrical measurement capabilities of microwave vector network analyzer with spatial resolution of atomic force microscope. SMM nose cone is particularly useful for testing and characterizing semiconductors. It enables complex impedance measurements, and can be used to acquire calibrated capacitance and dopant density measurements as well. This story is related to the following:Mechanical Components and AssembliesSearch for suppliers of: Nose Cones
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Microscopy Technique Could Help Computer Industry Develop 3D Components
2013-07-01 16:44:19| Semiconductors - Topix.net
A technique developed several years ago at the National Institute of Standards and Technology for improving optical microscopes now has been applied to monitoring the next generation of computer chip circuit components, potentially providing the semiconductor industry with a crucial tool for improving chips for the next decade or more.
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industry
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Microscopy technique could help computer industry develop 3-D components
2013-06-29 17:03:59| Semiconductors - Topix.net
The technique, called Through-Focus Scanning Optical Microscopy , has now been shown able to detect tiny differences in the three-dimensional shapes of circuit components, which until very recently have been essentially two-dimensional objects.
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industry
develop
components
Microscopy technique could help computer industry develop 3-D components
2013-06-26 16:03:47| Semiconductors - Topix.net
A technique developed several years ago at the National Institute of Standards and Technology for improving optical microscopes now has been applied to monitoring the next generation of computer chip circuit components, potentially providing the semiconductor industry with a crucial tool for improving chips for the next decade or more.
Tags: computer
industry
develop
components
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