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Tag: microscopy
3D Surface Measuring Systems use white light/confocal microscopy.
2014-06-04 14:30:31| Industrial Newsroom - All News for Today
MarSurf® WM 100, which uses white light interferometer, and MarSurf CWM 100, which includes white light and confocal microscopy, are intended for measuring optical, technical, and reflecting surfaces and provide 3D topographical analysis. Both systems provide non-contact measurement of surface structures with sub-nanometer resolution. While confocal microscopy better serves measurement of dark surface structures, white light interferometry suits polished, shiny surfaces. This story is related to the following:Measuring Instruments | Surface Mount Assembly Equipment Inspection Systems | Surface Inspection Systems
Tags: white
systems
surface
measuring
Carl Zeiss Microscopy to Support BBC Cloud Lab Scientists
2014-05-23 06:00:00| Industrial Newsroom - All News for Today
Bugs, bats, and air cultures to be examined as blimp travels across the USA<br /> <br /> Thornwood, N.Y. – The world's largest airship, the Skyship 600, made its way through the clouds on a month long journey across the United States. A team of British scientists made the air trek in a blimp as part of a BBC expedition team to study the clouds and life activity in the air. Microscopes from Carl Zeiss Microscopy, LLC were used to assist in the research being conducted by the traveling ...This story is related to the following:Laboratory and Research Supplies and EquipmentStereo Microscopes | Inverted Microscopes | Electron Microscopes |
AFM Accessory enables scanning electrochemical microscopy.
2014-05-20 14:30:58| Industrial Newsroom - All News for Today
AFM-enabled Scanning Electrochemical Microscopy (SECM) mode, using Agilent atomic force microscope, lets scientists perform scanning electrochemical microscopy with nanoscale resolution on conductive and insulating samples. Enabling immediate data collection, EC SmartCart cartridge combines nanoelectrode with pre-mounted AFM tip. Features include bi-functional probes, in situ research capabilities, built-in potentiostat, dual-chamber glove box, and Agilent PicoView software. This story is related to the following:Microscope Accessories |
Tags: enables
accessory
scanning
microscopy
Compact Objective Assemblies simplify video microscopy.
2014-04-28 14:30:27| Industrial Newsroom - All News for Today
Helping reduce imaging system weight and size while maintaining optical performance, TECHSPEC® Compact Objective Assemblies (2X, 5X and 10X) optimize each objective to allow for shorter tube lengths. Products are offered with standardized 30 mm ODs and C-mount threading to facilitate integration into system subassemblies, and magnification is user-configurable via addition of spacers. Each lens includes broadband anti-reflection coating to provide even light transmission in VIS spectrum. This story is related to the following:Microscope Objectives
Tags: video
compact
objective
simplify
Nanopositioning for Electron Microscopy Applications, New Brochure Released by PI
2014-04-01 06:00:00| Industrial Newsroom - All News for Today
PI’s new brochure covers a variety of novel actuators, stages and scanning systems, mostly based on the piezo effect. These ceramic drives are vacuum compatible and can also be manufactured in non-magnetic versions, important for electron microscopy environments.<br /> <br /> Large Variety of Drive Systems<br /> Piezo flexure stages for fast scanning applications, piezo stick-slip motor drives for economical, compact long-range motion and ultrasonic-ceramic motors for high-speed motion ...
Tags: applications
released
pi
brochure
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