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Teradyne Introduces the Magnum V Memory Test System
2014-07-07 19:53:05| Electronics - Topix.net
Teradyne, Inc. announces the Magnum V, the next generation memory test solution in the Nextest Magnum product line designed for massively parallel memory test in the Flash, DRAM and multi chip package marketplace.
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test
memory
introduces
PXI-based Test System accelerates LTE waveform creation.
2014-07-07 14:30:40| Industrial Newsroom - All News for Today
Providing tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in frequency and modulation domains simultaneously, LTE/LTE-Advanced Multi-channel PXI-based Test Solution helps engineers gain deep insight into complex carrier aggregation and spatial multiplexing MIMO designs. Chassis backplane trigger tool configures and routes backplane triggers for proper time synchronization in MIMO configuration for up to 2 PXIe chassis. This story is related to the following:Communications Testers |
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test
creation
waveform
Cable Test Kit tests and reports in full color.
2014-07-07 14:30:40| Industrial Newsroom - All News for Today
Suitable for any category network, coax, or telephone cable, Cable Prowler™ Pro Test Kit combines functions of cable tester and length measurement tester using TDR technology, with capability to identify link status, link capability, and PoE detection. System displays wire map, numbered ID remotes, and any faults, including shorts, opens, miswires, split pairs, and reverses. In addition to internal memory for saving results, kit offers ability to export to computer via micro USB cable. This story is related to the following:Test and Measuring Instruments Sponsored by: Red Lion Controls - UntitledSearch for suppliers of:
Teradyne Introduces the Magnum V Memory Test System
2014-07-07 13:21:13| Semiconductors - Topix.net
The Magnum V's scalable platform extends the capabilities of the Magnum product line with higher pin count, higher device under test parallelism, higher frequency, coverage for high-speed Flash and mobile DRAM, and lower per-pin cost for achieving a lower total cost-of-test.
Tags: system
test
memory
introduces
MESSRING Supplies Cutting-Edge Crash Test Facility to Chrysler Group LLC in Michigan
2014-07-07 06:00:00| Industrial Newsroom - All News for Today
New MicroTrack sled test facility in the USA measuring 220 meters in length/first M=LIGHT LED lamp series installed/curb test for ultra-modern side tests<br /> <br /> Munich – The vehicle safety requirements stipulated by institutes such as the New Car Assessment Programme (NCAP) and the Insurance Institute for Highway Safety (IIHS) are becoming more and more stringent and the associated test procedures more complex. As a result, vehicle manufacturers such as Chrysler need to install ...This story is related to the following:Electronic Components and DevicesElectrical Equipment and SystemsAutomotive Testers | Test Systems
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