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Tag: testing
Eaton Providing Distribution Equipment for U.S. Army Testing Facility
2015-02-17 18:30:00| Transmission & Distribution World
Eaton will help the U.S. Army modernize the electrical infrastructure of the Temperature Test Facility at the White Sands Missile Range (WSMR). read more
Tags: equipment
providing
distribution
testing
Keysight Technologies Selected by SGS for LTE Conformance, Device Acceptance Testing
2015-02-17 11:30:57| Industrial Newsroom - All News for Today
SANTA ROSA, Calif., Keysight Technologies, Inc. (NYSE: KEYS) today announced that SGS, the leading global inspection, verification, testing and certification company, has selected the Keysight T4010S LTE RF conformance test platform for use in its San Diego, California test lab. SGS will use the platform to...
Tags: selected
technologies
testing
device
JOT Automates Final Testing of Smart Wearables for Superior User Experience
2015-02-16 11:31:15| Industrial Newsroom - All News for Today
JOT Automation, the leading supplier of test and production solutions, automates the final testing of smart wearables for an enriched end-user experience and shortens the time-to-market in the highly competitive market. JOT G3, known as an all-in-one final tester for smartphones, also enables fully automatic tests...
Tags: user
experience
final
superior
Testing by recreational marine industry suggests up to 16.1% blends of isobutanol can be used in marine engines
2015-02-13 15:55:29| Green Car Congress
Tags: in
used
industry
testing
Digital Stimulus/Response Module aids RF chipset testing.
2015-02-13 14:30:21| Industrial Newsroom - All News for Today
Featuring parametric measurement unit (PMU), 16-channel PXIe digital stimulus/response module offers accelerated and flexible RF chipset test emulation and device characterization. Pattern cyclizer technology enables on-the-fly pattern creation for single site or up to 4 independent multi-sites with high-voltage channels and open drain pins for simultaneous device test. Capable of emulating serial and parallel digital device interfaces, module offers 1 ns-per-bit edge placement resolution.
Tags: digital
testing
aids
module
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