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Tag: metrology
New High-Speed Piezo Z-Stage And Digital Controller Value Packages For Microscopy / Metrology, Released By PI
2016-02-09 03:48:35| metrologyworld Home Page
Industry leader in motion and precision positioning components and systemsPI (Physik Instrumente) L.P.has released several controller & stage value packages for microscopy and metrology applications
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digital
released
packages
Attendee Registration Opens For The 2016 Coordinate Metrology Society Conference (CMSC)
2016-02-09 03:36:49| metrologyworld Home Page
TheCoordinate Metrology Society(CMS), the eminent membership association for 3D measurement professionals, today announced its online attendee registration is open for theCoordinate Metrology Society Conference(CMSC)
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registration
conference
opens
New High-Speed Piezo Z-Stage and Digital Controller Value Packages for Microscopy / Metrology, Released by PI
2016-02-01 11:31:12| Industrial Newsroom - All News for Today
Auburn, MA Industry leader in motion and precision positioning components and systems PI (Physik Instrumente) L.P. has released several controller stage value packages for microscopy and metrology applications. These affordable systems consist of a PIFOC high performance fast piezo focus mechanism and a compact...
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digital
released
packages
Automated Metrology Sensor provides in-process measurement.
2016-01-14 14:31:06| Industrial Newsroom - All News for Today
Combining blue light projection, stereo cameras, and on-board processing, Cobalt 3D Imager captures and processes millions of 3D data points in seconds. Unlimited number of 3D imagers can be placed in array configurations virtually anywhere in manufacturing process — all scanning simultaneously and controlled by single computer. With high resolution, automatic exposure, and high dynamic range, Cobalt handles complex parts with fine details as well as varying colors, textures, and reflectivity.
Tags: measurement
automated
sensor
metrology
Metrology Fundamentals Seminar will take place in late January.
2015-12-17 14:31:06| Industrial Newsroom - All News for Today
Taking place January 25–29, 2016 in Gaithersburg, MD, Fundamentals of Metrology will introduce participants to concepts of measurement systems, units, measurement uncertainty/assurance, traceability, basic statistics, and how they fit into lab Quality Management System. Those and additional topics, including overall Laboratory Management and Laboratory Quality Management Systems as well as various requirements, will be covered via lecture, hands-on exercises, case studies, and discussion.
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january
late
seminar
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