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Metrology System supports 3D wafer fabrication.

2015-07-16 14:31:08| Industrial Newsroom - All News for Today

By offering wide range of metrology measurements that drive tighter process control for critical parameters in Logic, Flash, and DRAM, HelioSense100™ Optical CD System supports industry transition to multi-patterning small pitch manufacturing and 3D vertical devices. Standalone system is optimized by NovaMARS modeling software and Nova's high-performance computation solution, allowing customers to utilize system from early R/D stages through to manufacturing and device maturity.

Tags: system supports fabrication wafer

 

NOVA Extends Its Optical CD Portfolio With New Metrology Solution For Advanced Technology Nodes

2015-07-16 03:39:34| metrologyworld News Articles

Nova Measuring Instruments(Nasdaq:NVMI), a leading innovator and key provider of metrology solutions for advanced process control used in semiconductor manufacturing, announced today the launch of its new standalone Optical CD system, the HelioSense100TM, targeted at the most complex device manufacturing across the semiconductor segments

Tags: advanced technology solution nova

 
 

Coordinate Metrology Society Hosts Hollywood Metrology Days During The 2015 Coordinate Metrology Systems Conference In Hollywood, FL

2015-07-10 05:57:30| metrologyworld Home Page

TheCoordinate Metrology Society(CMS), the eminent membership association for measurement professionals, today announced they will host Hollywood Metrology Days during the 31stannual Coordinate Metrology Systems Conference (CMSC), July 20 – 24, at The Diplomat Hotel in Hollywood, FL

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Multiple Foundries In Asia Select Jordan Valley's JVX7300HR X-Ray Metrology Tool

2015-07-10 04:11:16| metrologyworld Home Page

Jordan Valley(JV), a leading supplier of X-ray based in-line metrology solutions for advanced semiconductor manufacturers, today announced that it has received orders for its latest generation JVX7300HR front-end-of-line (FEOL) strain & thin-film metrology tool from multiple foundries inAsia

Tags: select multiple tool asia

 

New 3D Metrology Software From FARO Delivers Increased Productivity With Simultaneous Measurement Capabilities

2015-07-10 04:03:13| metrologyworld Home Page

FARO Technologies, Inc. (NASDAQ:FARO), the world's most trusted source for 3D measurement, imaging and realization technology, announces the release of CAM2 Measure 10.5, its latest software for the FaroArm, FARO®ScanArm, FARO®Laser Tracker, and FARO®3D Imager

Tags: software increased measurement capabilities

 

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