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Tag: metrology
Metrology System supports 3D wafer fabrication.
2015-07-16 14:31:08| Industrial Newsroom - All News for Today
By offering wide range of metrology measurements that drive tighter process control for critical parameters in Logic, Flash, and DRAM, HelioSense100™ Optical CD System supports industry transition to multi-patterning small pitch manufacturing and 3D vertical devices. Standalone system is optimized by NovaMARS modeling software and Nova's high-performance computation solution, allowing customers to utilize system from early R/D stages through to manufacturing and device maturity.
Tags: system
supports
fabrication
wafer
NOVA Extends Its Optical CD Portfolio With New Metrology Solution For Advanced Technology Nodes
2015-07-16 03:39:34| metrologyworld News Articles
Nova Measuring Instruments(Nasdaq:NVMI), a leading innovator and key provider of metrology solutions for advanced process control used in semiconductor manufacturing, announced today the launch of its new standalone Optical CD system, the HelioSense100TM, targeted at the most complex device manufacturing across the semiconductor segments
Tags: advanced
technology
solution
nova
Coordinate Metrology Society Hosts Hollywood Metrology Days During The 2015 Coordinate Metrology Systems Conference In Hollywood, FL
2015-07-10 05:57:30| metrologyworld Home Page
TheCoordinate Metrology Society(CMS), the eminent membership association for measurement professionals, today announced they will host Hollywood Metrology Days during the 31stannual Coordinate Metrology Systems Conference (CMSC), July 20 – 24, at The Diplomat Hotel in Hollywood, FL
Tags: days
systems
society
conference
Multiple Foundries In Asia Select Jordan Valley's JVX7300HR X-Ray Metrology Tool
2015-07-10 04:11:16| metrologyworld Home Page
Jordan Valley(JV), a leading supplier of X-ray based in-line metrology solutions for advanced semiconductor manufacturers, today announced that it has received orders for its latest generation JVX7300HR front-end-of-line (FEOL) strain & thin-film metrology tool from multiple foundries inAsia
Tags: select
multiple
tool
asia
New 3D Metrology Software From FARO Delivers Increased Productivity With Simultaneous Measurement Capabilities
2015-07-10 04:03:13| metrologyworld Home Page
FARO Technologies, Inc. (NASDAQ:FARO), the world's most trusted source for 3D measurement, imaging and realization technology, announces the release of CAM2 Measure 10.5, its latest software for the FaroArm, FARO®ScanArm, FARO®Laser Tracker, and FARO®3D Imager
Tags: software
increased
measurement
capabilities
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