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ZEISS Industrial Metrology Surface and Roundness Measurement Systems Offer Additional Analysis for Increased Productivity
2015-05-08 12:31:09| Industrial Newsroom - All News for Today
MAPLE GROVE, Minn. -- The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with their new detectors. SURFCOM NEX 100 offers a single hybrid detector to measure surface texture and contour at the same time. RONDCOM NEX Rs offers best-in-class spindle accuracy and...
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ZEISS Industrial Metrology Surface And Roundness Measurement Systems Offer Additional Analysis For Increased Productivity
2015-05-08 07:56:16| metrologyworld Home Page
The NEX series of instruments from ZEISS Industrial Metrology integrate additional measurement analysis with their new detectors
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analysis
X-Ray Based CMM is designed for metrology.
2015-05-07 14:31:06| Industrial Newsroom - All News for Today
Along with 225 kV X-ray source with 2 micron minimum detectability, CXMM 50 features built-in temperature control and vibration-isolated granite table that promote precise and accurate measurements. X-ray test system, suited for use as product development and QC tool, is fitted with flat panel DDA detector and intended for inspection of workpieces up to 11 kg with envelope up to 30 x 30 cm. Other features include 5-axis manipulator, adjustable magnification, and paired software package.
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Pencil Probe Linear Position Sensors serve metrology applications.
2015-05-05 14:31:07| Industrial Newsroom - All News for Today
Offered in stock ranges ±0.5, ±1.0, and ±2.5 mm, DGP spring-extend, AC-LVDT-based, dimensional gauging probes (pencil probes) operate from -10 to +65°C and offer 0.5 micron resolution and repeatability. Construction includes precision ground bearings, 8 mm dia plain outer body, and optional sleeve for increasing OD to 0.375 in. (plain or partly threaded). Included 2 m long axial shielded cable is strain relieved and can be converted to radial cable outlet with right angle cable adapter.
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Rudolph Receives Multiple System Orders for Inspection, Metrology and Analytics of High-end Frequency Filters
2015-04-23 12:31:14| Industrial Newsroom - All News for Today
Tools will be used to accelerate ramp and improve yields for SAW/BAW filters, a critical enabling technology for smartphones Flanders, New Jersey Rudolph Technologies, Inc. (NYSE: RTEC) announced today that it has received multiple orders from a leading radio frequency (RF) filter manufacturer that includes five...
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