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Digital I/O Device offers input and output rates to 8 MS/s.

2015-07-14 14:31:09| Industrial Newsroom - All News for Today

Providing 32 high-speed digital I/O channels, Model USB-DIO32HS features independent input and output scan clocks, hardware and software triggering, and pattern detection/generation. Microsoft Windows software options include TracerDAQ® to display and log data, along with comprehensive support for C®, C++®, C#®, Visual Basic®, and Visual Basic .NET™. Support is also included for DASYLab® and NI LabVIEW™. With support for Android™, users can develop DAQ applications for tablets and smartphones.

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Multichannel Potentiostat provides 1 MS/s sampling rate.

2015-04-30 14:31:06| Industrial Newsroom - All News for Today

Installed into PMC CHS08A chassis and driven by VersaStudio software, PMC-2000 Channel adds capabilities to PARSTAT MC family of modular potentiostats, providing additional voltage measurement 6-wire capabilities, EIS accuracy to 7 MHz, 30 V Compliance and Polarization, and 1 A of current. Hot-swappable channels permit researchers to add or remove channel without interruption while running experiment. With data acquisition speed of 1 µs, unit is suited for high-speed applications.

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MSS Employee Emergency Communication Information

2014-10-09 17:06:29| PortlandOnline

PDF Document, 190kbCategory: SAP Employee Emergency Contact Instructions

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MSS Managers: new HR 2.02 report available

2014-06-30 20:19:06| PortlandOnline

22 May 2014

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Source Measurement Unit supports measurement rates to 1.8 MS/s.

2014-03-04 14:30:45| Industrial Newsroom - All News for Today

With pulsing capability up to 500 W and current measurement sensitivity down to 100 fA, NI PXIe-4139 source measure unit (SMU) offers up to 17 SMU channels in 4U 19 in. rack space and enables engineers and scientists to test range of devices with one instrument. NI SourceAdapt technology helps engineers produce optimal SMU response to any load by customizing SMU control loop. Measurements rate reduces test time and enables capture of transient device behavior without external scope.<br /> This story is related to the following:Measuring Instruments

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