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Scanning Slit Laser Beam Profiler offers sub-micron measurement.

2015-11-05 14:31:06| Industrial Newsroom - All News for Today

Using moving slits, NIST-calibrated NanoScan™ 2s measures beam position and size with sub-micron precision for CW and kilohertz pulsed lasers. Offering of silicon, germanium, or pyroelectric detectors allows profiling lasers of any wavelength, from UV to far infrared, to 100 µm and beyond. Digital controller, by providing 16-bit digitization of signal for dynamic range up to 35 dB power, enables measurement of beam size and pointing with 3-sigma precision to several hundred nanometers.

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AB Graphic announces new Auto Slit

2013-12-02 06:00:00| Label and Narrow Web Breaking News

Auto Slit is a new digital knife box that automates slitting and set-up for labels and packaging production through HMI touch screen interface.

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Slit Lamp provides up to x40 magnification.

2013-05-29 14:30:15| Industrial Newsroom - All News for Today

Utilizing Galilean converging binoculars and rotating 5-step drum that offers x40 magnification, Symphony Slit Lamp features tower illumination and slit projection system with continuously variable slit widths from 0–12 mm. Blue, red free, and neutral density filters and integral diffuser provide visual of whole eye at low magnification. To assess for Uveitis, 1 mm square graticule is included within aperture selections. Integral yellow fluorescein barrier filter is housed in optics block. This story is related to the following:Ophthalmic Lamps

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Scanning Slit Laser Beam Profiler features USB2 interface.

2013-02-11 14:32:44| Industrial Newsroom - All News for Today

Using moving slits, NIST-calibrated NanoScan 2 measures continuous wave (CW) and pulsed beams across spectral range from UV to far IR. Beam size and beam pointing can be measured with 3 sigma precision of several hundred nanometers. While USB2 interface provides deep, 12-bit digitization of signal for dynamic range up to 35 dB power, digital controller improves accuracy and stability of measurements. Software can measure 1–16 beams in NanoScan aperture, all with sub-micron precision. This story is related to the following:Optics and PhotonicsSearch for suppliers of:

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