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Tag: metrology
More Leading Semiconductor Players Selecting Jordan Valley's JVX7300LMI Metrology Tool For 14nm & 10nm Process Development And Ramp-Up
2013-10-04 06:01:42| metrologyworld Home Page
Jordan Valley SemiconductorsLtd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that it has received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket wafers
Tags: development
process
leading
tool
More Leading Semiconductor Players Selecting Jordan Valley's JVX7300LMI Metrology Tool for ...
2013-10-01 06:00:00| Industrial Newsroom - All News for Today
MIGDAL HAEMEK, Israel – Jordan Valley Semiconductors [<a href="http://www.jordanvalley.com">http://www.jordanvalley.com</a>] Ltd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that it has received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket wafers. The system has been purchased for advanced process development and production ramp-up for 14nm and ...This story is related to the following:Laboratory and Research Supplies and EquipmentX-Ray Inspection Systems | Metrology Instruments
Tags: leading
tool
players
jordan
Nexview 3D Imaging And Surface Metrology System With High Precision, Flexibility And Speed Introduced By Zygo
2013-09-05 09:35:08| metrologyworld News Articles
Zygo Corporation (Nasdaq:ZIGO) today announced the Nexview™ profiler, its next-generation 3D imaging and measurement system for rapid, precise, quantitative, and interactive surface metrology
ReVera Announces New Inline Thin Film Metrology System
2013-09-05 09:24:43| metrologyworld News Articles
ReVera, the leader in advanced film thickness and composition metrology, announces a new production metrology system for complex film process control
3D Imaging System supports non-contact surface metrology.
2013-08-29 14:30:51| Industrial Newsroom - All News for Today
Suited for both production and scientific research markets, Nexview™ Profiler supports non-contact metrology of samples and surfaces ranging from very smooth to very rough. System provides sub-nanometer vertical resolution at all magnifications, and will safely measure fragile and transparent materials without altering test surface. Acting as interface for system control and data analysis, Mx™ software provides interactive 3D maps, quantitative topography information, and intuitive navigation. This story is related to the following:Test and Measuring InstrumentsMetrology Equipment | Imaging Systems
Tags: system
surface
supports
imaging
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