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More Leading Semiconductor Players Selecting Jordan Valley's JVX7300LMI Metrology Tool For 14nm & 10nm Process Development And Ramp-Up

2013-10-04 06:01:42| metrologyworld Home Page

Jordan Valley SemiconductorsLtd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that it has received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket wafers

Tags: development process leading tool

 

More Leading Semiconductor Players Selecting Jordan Valley's JVX7300LMI Metrology Tool for ...

2013-10-01 06:00:00| Industrial Newsroom - All News for Today

MIGDAL HAEMEK, Israel &ndash; Jordan Valley Semiconductors [<a href="http://www.jordanvalley.com">http://www.jordanvalley.com</a>] Ltd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that it has received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket wafers. The system has been purchased for advanced process development and production ramp-up for 14nm and ...This story is related to the following:Laboratory and Research Supplies and EquipmentX-Ray Inspection Systems | Metrology Instruments

Tags: leading tool players jordan

 
 

Nexview 3D Imaging And Surface Metrology System With High Precision, Flexibility And Speed Introduced By Zygo

2013-09-05 09:35:08| metrologyworld News Articles

Zygo Corporation (Nasdaq:ZIGO) today announced the Nexview™ profiler, its next-generation 3D imaging and measurement system for rapid, precise, quantitative, and interactive surface metrology

Tags: by high system speed

 

ReVera Announces New Inline Thin Film Metrology System

2013-09-05 09:24:43| metrologyworld News Articles

ReVera, the leader in advanced film thickness and composition metrology, announces a new production metrology system for complex film process control

Tags: system film thin inline

 

3D Imaging System supports non-contact surface metrology.

2013-08-29 14:30:51| Industrial Newsroom - All News for Today

Suited for both production and scientific research markets, Nexview&trade; Profiler supports non-contact metrology of samples and surfaces ranging from very smooth to very rough. System provides sub-nanometer vertical resolution at all magnifications, and will safely measure fragile and transparent materials without altering test surface. Acting as interface for system control and data analysis, Mx&trade; software provides interactive 3D maps, quantitative topography information, and intuitive navigation. This story is related to the following:Test and Measuring InstrumentsMetrology Equipment | Imaging Systems

Tags: system surface supports imaging

 

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