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Tag: metrology
Renishaw acquires US metrology specialist
2014-04-15 19:12:00| Renishaw News
Renishaw, a world leading engineering technologies company, has purchased the business of Advanced Consulting & Engineering, Inc (ACE), a US-based supplier of dimensional measurement products and services focused on the automotive industry.
Tags: specialist
acquires
metrology
renishaw
Parker Energy Products Division-Umbilicals, Subsea Power Cables, Mooring Lines, Loading and Off-Loading Marine Hose, High-Pressure Hose, Tubing Bundles and Subsea Survey and Metrology
2014-04-10 01:00:00| Offshore Technology
Parker Hannifin is the world's leading diversified manufacturer of motion and control systems and technologies.
Tags: and
products
power
lines
Metrology Lab performs critical testing and analysis.
2014-04-03 14:30:58| Industrial Newsroom - All News for Today
At 2,000 ft² Metrology Laboratory, technical staff provides critical test and analysis data during product lifecycle. Addition of scanning electron microscope responds to internal and customer requirements for material and performance analysis. Along with SEM imaging, lab performs EDS elemental composition analysis, thermal imaging, X-ray imaging, finite element analysis, micro-hardness analysis, and microstructural analysis such as grain size measurement, inclusion level, and weld penetration. This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Testing Services | Imaging Services | Metrology Laboratories |
Tags: analysis
critical
testing
lab
Hexagon Metrology Launches Smart Inline Measurement Solutions
2014-03-07 04:25:44| metrologyworld News Articles
Hexagon Metrology announced today the launch of 360° Smart Inline Measurement Solutions (360° SIMS), a new family of measurement solutions that can be fully integrated into demanding automotive production lines to serve manufacturers during launch, ramp-up and ongoing production
Tags: solutions
smart
measurement
inline
Metrology System offers non-destructive, 3D surface profiling.
2014-02-20 14:31:07| Industrial Newsroom - All News for Today
Combining lateral resolution up to 140 nm via confocal microscopy and vertical resolution up to 0.1 nm with interferometry, Leica DCM8 provides surface analysis of materials and components. Instrument is also suitable for color documentation of samples. Wide choice of Leica objectives, together with 4 LED light sources and integrated CCD camera, deliver true-to-life color images. With XY topography-stitching mode, users can obtain seamless, precise model of larger area. This story is related to the following:Machinery and Machining Tools Sponsored by: Haas Automation, Inc. - Category SponsorLaboratory and Research Supplies and EquipmentSurface Profilers | Confocal Microscopes | Profiling Machinery | Metrology Instruments |
Tags: system
offers
surface
profiling
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