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Tag: metrology
Improving Productivity Through Metrology
2014-02-18 06:00:00| Industrial Newsroom - All News for Today
Recently, BC Engineering and Design performed a detailed alignment of a custom induction Heat Treat Machine (IHTM). The manufacturing facility was experiencing inconsistent surface heat treat results with their precision machined parts. Initial measurements showed that the machine was not level or parallel. The frame of the machine was out of alignment by greater than 1/2". The desired specification was to maintain ±0.020". Over a period of time, the machine had been modified and "tweaked" in ...This story is related to the following:Laboratory and Research Supplies and EquipmentOptics and PhotonicsSearch for suppliers of: Metrology Equipment | Laser Alignment Tools | Metrology Instruments
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productivity
metrology
improving productivity
Benchtop 3D Optical Profilers offer enhanced metrology abilities.
2014-02-12 14:31:07| Industrial Newsroom - All News for Today
Based on non-contact optical technology and powered by Mx™ software, NewView™ 8000 series meets metrology requirements of applications in scientific research, product/process development, and manufacturing. Modular platform provides hundreds of surface results and analyses, including ISO 25178 area surface texture parameters for quantitative analysis. Features include surface visualization and surface detection algorithms and real-time interactive analysis with 2D and 3D plotting technology. This story is related to the following:Machinery and Machining Tools Sponsored by: Haas Automation, Inc. - Category SponsorSearch for suppliers of:
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enhanced
optical
abilities
Rudolph Ships New NSX 320 TSV Metrology System to CEA-Leti for through Silicon Via Process ...
2014-02-11 06:00:00| Industrial Newsroom - All News for Today
First NSX 320 Metrology system sold specifically for TSV application includes specialized sensors to measure critical parameters in 3D integration<br /> <br /> Flanders, New Jersey — Rudolph Technologies, Inc. (NYSE: RTEC) announced today the sale of its first NSX® 320 TSV Metrology System to CEA-Leti, a leading research organization based in Grenoble, France, which, in the frame of the Nanoelec Research Technology Institute (Nanoelec RTI) program, is developing three-dimensional ...This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Printed Circuit Board (PCB) Inspection Systems
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via
process
ships
Leica Geosystems And Hexagon Metrology Renew Global Network Contract With Orange Business Services
2014-02-07 06:18:34| metrologyworld News Articles
Leica Geosystems and Hexagon Metrology have signed a 4-year contract renewal with Orange Business Services for a global Wide Area Network (WAN) connecting all of their 68 sites in 28 countries, including several in high-growth markets
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business
network
global
Frost & Sullivan: Product Introductions Boost The Global Metrology Probes And Scanners Market
2014-02-07 06:14:23| metrologyworld News Articles
The escalating need for dimensional measurement in automotive, aerospace and defence, machines shop, and other industries has resulted in the introduction of vastly improved technology and product lines in the global metrology probes and scanners market
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market
global
boost
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