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Tag: metrology
Park Systems Joins Forces With imec To Develop Advancements In Nanoscale AFM Metrology Solutions For Semiconductor Manufacturing
2015-03-12 07:39:15| metrologyworld Home Page
Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness, critical dimension (CD), and sidewall roughness
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park
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Park Systems Announces Joint Development Partnership with imec to Develop Nanoscale AFM Metrology Solutions for Semiconductor Manufacturing
2015-03-09 11:31:11| Industrial Newsroom - All News for Today
SUWON, Korea Park Systems, world-leader in Atomic Force Microscopes (AFM) announced today they have signed a Joint Development Project (JDP) with nanoelectronics research center imec, to develop in-line AFM metrology solutions of future technology nodes including but not limited to surface roughness, thickness...
Tags: development
systems
park
solutions
KLA-Tencor Extends Its 5D(TM) Patterning Control Solution with New Metrology Systems
2015-02-26 11:31:44| Industrial Newsroom - All News for Today
Comprehensive Overlay and Films Process Control Solutions Address Advanced IC Process Challenges MILPITAS, Calif. Today, KLA-Tencor Corporation (NASDAQ: KLAC) introduced two advanced metrology systems that support the development and production of 16nm and below IC devices: Archer 500LCM and SpectraFilm LD10...
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systems
solution
extends
Metrology System provides 3D tube and wire measurement.
2015-02-24 14:30:40| Industrial Newsroom - All News for Today
Equipped with 8 high-resolution cameras, TubeInspect P8 is suitable for tubes and wires with diameters from 1–125 mm and allows for optimum 3D inspection of objects up to 1 m in length or more. Lateral doors allow for overlapping repositioning section by section. Measuring results are provided within 2–5 seconds and sheath tolerance can be determined to accuracy of 0.035 mm. Combined with BendingStudio software platform, system offers various application-oriented functionalities.
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wire
tube
measurement
BuildIT Releases Latest Version Of 3D Metrology Software - BuildIT 2015
2015-02-12 04:49:21| metrologyworld Home Page
BuildIT Software & Solutions Ltd. is pleased to announce the release of BuildIT 2015, a major update to the 3D metrology software
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